TEST: Testing environment for embedded systems based on TTCN-3 in SILS

DOI10.1007/978-3-642-10619-4_25MaRDI QIDQ5305786zbMATH OpenOpenAlexFDO

Authors Hochang Chae, Xiulin Jin, Seonghun Lee, Jeonghun Cho

Publication date 23 March 2010

Published in Advances in Software Engineering (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/978-3-642-10619-4_25

zbMATH Keywords

embedded system softwaretesting environmentTTCN-3 testing system

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15) Computer system organization (68M99) Theory of software (68N99)

Recommendations

• An introduction to the testing and test control notation (TTCN-3).
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Cited in

(6)

• An introduction to the testing and test control notation (TTCN-3).
• TEST
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• DynaTest and beyond: From dynamic testing to automated error-prevention and error-detection
• scientific article; zbMATH DE number 2013773 (Why is no real title available?)
• Formal Approaches to Software Testing

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