Test Generation for Microprocessors

DOI10.1109/TC.1980.1675602MaRDI QIDQ3877584zbMATH OpenOpenAlexFDO

Authors Satish M. Thatte, Jacob A. Abraham

Publication date 1980

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tc.1980.1675602

zbMATH Keywords

architecture modelscomplexity of testsfunctional level fault modelsmicroprocessor architecturetest programs

Mathematics Subject Classification ID

Cited in

(3)

• Testing diagnostics of modern microprocessors with the use of functional models
• Functional test generation using binary decision diagrams
• A systematic technique for detecting and locating bridging and stuck-at faults in I/O pins of LSI/VLSI chips

This page was built for publication: Test Generation for Microprocessors

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q3877584)