Testing or fault-finding for reliability growth: A missile destructive-test example

DOI10.1002/(SICI)1520-6750(199710)44:7%3C623::AID-NAV2%3E3.0.CO;2-EMaRDI QIDQ4363417zbMATH OpenOpenAlexFDO

Authors P. A. Jacobs, D. P. jun. Gaver

Publication date 6 November 1997

Full work available at URL https://doi.org/10.1002/(sici)1520-6750(199710)44:7%3C623::aid-nav2%3E3.0.co;2-e

zbMATH Keywords

Bayesian sequential analysisdestructive testingPoisson processreliability growth

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25)

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