The Design of Truncated Sequential Test Plans Based on Attributes Data

DOI10.1081/SAC-200033306MaRDI QIDQ3155631zbMATH OpenFDO

Authors Thomas P. McWilliams

Publication date 17 January 2005

Published in Communications in Statistics. Simulation and Computation (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1081/SAC-200033306

Mathematics Subject Classification ID

Sequential statistical analysis (62L10)

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Cites work

• Applications of the Direct Method in Sequential Analysis
• scientific article; zbMATH DE number 3557073 (Why is no real title available?)
• scientific article; zbMATH DE number 3045589 (Why is no real title available?)
• Optimum Character of the Sequential Probability Ratio Test

Cited in

(1)

• An innovative Bayesian sequential censored sampling inspection method and application to test design

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