The Dutch draw: constructing a universal baseline for binary classification problems

DOI10.1017/JPR.2024.52MaRDI QIDQ6879261zbMATH OpenFDO

Authors Etienne Van de Bijl, Jan Klein, Sandjai Bhulai, Mark Hoogendoorn, R. D. van der Mei

Publication date 2 January 2026

Published in Journal of Applied Probability (Search for Journal in Brave)

Full work available at URL https://research.vu.nl/en/publications/71842d26-beb3-49f0-934f-ebada3af6016

zbMATH Keywords

baselinesupervised learningevaluationbinary classificationbenchmark

Mathematics Subject Classification ID

Classification and discrimination; cluster analysis (statistical aspects) (62H30) Hypothesis testing in multivariate analysis (62H15) Empirical decision procedures; empirical Bayes procedures (62C12) Probability in computer science (algorithm analysis, random structures, phase transitions, etc.) (68Q87) Fuzziness and design of statistical experiments (62K86)

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