The application of statistical simulation to automated analog test development

DOI10.1109/TCS.1979.1084668MaRDI QIDQ4198653zbMATH OpenFDO

Authors Norman J. Elias

Publication date 1979

Published in IEEE Transactions on Circuits and Systems (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/TCS.1979.1084668

zbMATH Keywords

analog circuit testingfault diagnosisstatistical simulation

Mathematics Subject Classification ID

Reliability and life testing (62N05) Monte Carlo methods (65C05) Fault detection; testing in circuits and networks (94C12)

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Cited in

(1)

• Automatic test generation techniques for analog circuits and systems: A review

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