To impute or to adapt? Model specification tests' perspective

DOI10.1007/S00362-023-01421-4MaRDI QIDQ6549171zbMATH OpenFDO

Authors Marija Cuparić, B. Milošević

Publication date 3 June 2024

Published in Statistical Papers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/S00362-023-01421-4

zbMATH Keywords

Bezier curveexponentiality testsIPCWmissing not at random datasurvival datatwo-sample tests

Mathematics Subject Classification ID

Statistics (62-XX)

Cites work

• A generalized Wilcoxon test for comparing arbitrarily singly-censored samples
• A Note on Tests for Monotone Failure Rate Based on Incomplete Data
• A permutation test for the two-sample right-censored model
• A simple non-parametric test for decreasing mean time to failure
• An Empirical Analysis of Some Nonparametric Goodness-of-Fit Tests for Censored Data
• Asymptotic distribution of the Kaplan-Meier U-statistics.
• Asymptotic properties of inverse probability of censored weighted U-empirical process for right-censored data with applications
• Bezier curve smoothing of the Kaplan-Meier estimator
• Bootstrap- and permutation-based inference for the Mann-Whitney effect for right-censored and tied data
• Characteristic function and Laplace transform-based tests for exponentiality in the presence of random right censoring
• Distribution-free goodness-of-fit tests for the Pareto distribution based on a characterization
• Estimation of the Mann-Whitney effect in the two-sample problem under dependent censoring
• Flexible imputation of missing data
• Goodness-of-fit test for randomly censored data based on maximum correlation
• Goodness-of-Fit Tests Based on Maximum Correlations and Their Orthogonal Decompositions
• Goodness-of-fit tests for Pareto distribution based on a characterization and their asymptotics
• scientific article; zbMATH DE number 3537064 (Why is no real title available?)
• Inverse probability of censoring weighted U-statistics for right-censored data with an application to testing hypotheses
• Kaplan-Meier V- and U-statistics
• New L^2-type exponentiality tests
• New characterization-based exponentiality tests for randomly censored data
• New class of exponentiality tests based on U-empirical Laplace transform
• New consistent exponentiality tests based on V-empirical Laplace transforms with comparison of efficiencies
• Tests of fit for a lognormal distribution
• The strong law of large numbers for Kaplan-Meier \(U\)-statistics

Cited in

(1)

• Goodness-of-fit testing in the presence of cured data: IPCW approach

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