Two-phased meta-heuristic methods for the post-mapping yield control problem

DOI10.1080/00207540600619726MaRDI QIDQ3430254zbMATH OpenOpenAlexFDO

Authors

Publication date 21 March 2007

Published in International Journal of Production Research (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1080/00207540600619726

zbMATH Keywords

color filter (CF)genetic algorithmlinear programmingliquid crystal display (LCD)post mappingsimulated annealingthin film transistor (TFT)

Mathematics Subject Classification ID

Linear programming (90C05) Approximation methods and heuristics in mathematical programming (90C59)

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Cites work

• Machining condition optimization by genetic algorithms and simulated annealing

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