Using Weighted Scan Enable Signals to Improve Test Effectiveness of Scan-Based BIST

DOI10.1109/TC.2007.70767MaRDI QIDQ4564254zbMATH OpenOpenAlexFDO

Authors Dong Xiang, Mingjing Chen, Hideo Fujiwara

Publication date 12 June 2018

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tc.2007.70767

Mathematics Subject Classification ID

Signal theory (characterization, reconstruction, filtering, etc.) (94A12)

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