Using statistical models for optimal packaging in semiconductor manufacturing processes

DOI10.1007/S42952-024-00284-1MaRDI QIDQ6997816zbMATH OpenFDO

Authors Dongguen Kim, Yejin Kim, Minwoo Chae, Young Myoung Ko, Young-Mok Bae, Hyungsub Sim, Young Chan Oh, Keum Hwan Noh

Publication date 14 April 2025

Published in Journal of the Korean Statistical Society (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/S42952-024-00284-1

zbMATH Keywords

gradient boostingoptimal packagingquality analysissemiconductor manufacturingsemiconductor yield

Mathematics Subject Classification ID

Statistics (62-XX)

Cites work

• A review of yield modelling techniques for semiconductor manufacturing
• Additive logistic regression: a statistical view of boosting. (With discussion and a rejoinder by the authors)
• Bayes estimation subject to uncertainty about parameter constraints
• Greedy function approximation: A gradient boosting machine.
• scientific article; zbMATH DE number 3930122 (Why is no real title available?)
• Kumaraswamy's distribution: a beta-type distribution with some tractability advantages
• Pareto distributions
• Stochastic gradient boosting.

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