Yield maximization and worst-case design with arbitrary statistical distributions

DOI10.1109/TCS.1980.1084889MaRDI QIDQ3893861zbMATH OpenOpenAlexFDO

Authors Stephen W. Director, Gary D. Hachtel, Robert K. Brayton

Publication date 1980

Published in IEEE Transactions on Circuits and Systems (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tcs.1980.1084889

zbMATH Keywords

linear programsimplicial approximationstatistical designworst-case designyield maximization

Mathematics Subject Classification ID

Applications of design theory to circuits and networks (94C30)

Cited in

(2)

• The use of stochastic analytic center for yield maximization of systems with general distributions of component values
• The \(C_ M\)-embedded problem and optimality conditions

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