Statistical Inference of a Time-to-Failure Distribution Derived from Linear Degradation Data (Q4369986): Difference between revisions

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Statistical Inference of a Time-to-Failure Distribution Derived from Linear Degradation Data
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Statistical Inference of a Time-to-Failure Distribution Derived from Linear Degradation Data (English)
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Latest revision as of 19:06, 19 March 2024

scientific article; zbMATH DE number 1104094
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English
Statistical Inference of a Time-to-Failure Distribution Derived from Linear Degradation Data
scientific article; zbMATH DE number 1104094

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    8 May 2000
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    bootstrap confidence interval
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    likelihood ratio test
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    random coefficients
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    reliability
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    standard-deviation function
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    semiconductor degradation
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    Statistical Inference of a Time-to-Failure Distribution Derived from Linear Degradation Data (English)
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