Statistical Inference of a Time-to-Failure Distribution Derived from Linear Degradation Data

DOI10.2307/1271503zbMATH Open0935.62114OpenAlexW2029196878MaRDI QIDQ4369986FDOQ4369986

Authors: Jye-Chyi Lu, Qing Yang, Jin-Ho Park 

Publication date: 8 May 2000

Full work available at URL: https://doi.org/10.2307/1271503

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zbMATH Keywords

reliabilitylikelihood ratio testrandom coefficientsbootstrap confidence intervalsemiconductor degradationstandard-deviation function

Mathematics Subject Classification ID

Reliability and life testing (62N05) Applications of statistics in engineering and industry; control charts (62P30)

Cited In (15)

• Degradation data analysis for samples under unequal operating conditions: a case study on train wheels
• Non-parametric estimation from simultaneous degradation and failure time data
• Stochastic modelling and analysis of degradation for highly reliable products
• Estimating percentiles of time-to-failure distribution obtained from a linear degradation model using kernel density method
• Degradation Modeling, Analysis, and Applications on Lifetime Prediction
• Statistical inference through AFT model for biotechnical systems
• A time-discrete and zero-adjusted gamma process model with application to degradation analysis
• Non-parametric analysis of a proportional wearout model for accelerated degradation data
• Assessment of Reliability in Accelerated Degradation Testing with Initial Status Incorporated
• Degradation data-driven remaining useful life estimation in the absence of prior degradation knowledge
• Reliability estimation through the linear mixed effects model
• Optimum percentile estimating equations for nonlinear random coefficient models
• Estimation of reliability with semi-parametric modeling of degradation
• Storage Life Prediction for a High-Performance Capacitor Using Multi-Phase Wiener Degradation Model
• Inferential statistics on the dynamic system model with time-dependent failure-rate

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