Study of Defect-Layers Effect in Ferroelectric Thin Film with Transverse Ising Model (Q2913490): Difference between revisions

From MaRDI portal
Import240304020342 (talk | contribs)
Set profile property.
Set OpenAlex properties.
 
Property / full work available at URL
 
Property / full work available at URL: https://doi.org/10.1088/0253-6102/56/6/15 / rank
 
Normal rank
Property / OpenAlex ID
 
Property / OpenAlex ID: W1580241352 / rank
 
Normal rank

Latest revision as of 22:12, 19 March 2024

scientific article
Language Label Description Also known as
English
Study of Defect-Layers Effect in Ferroelectric Thin Film with Transverse Ising Model
scientific article

    Statements

    Study of Defect-Layers Effect in Ferroelectric Thin Film with Transverse Ising Model (English)
    0 references
    0 references
    0 references
    0 references
    0 references
    0 references
    26 September 2012
    0 references
    ferroelectrics
    0 references
    phase transitions
    0 references
    defect-layer
    0 references

    Identifiers

    0 references
    0 references
    0 references
    0 references
    0 references
    0 references