Study of defect-layers effect in ferroelectric thin film with transverse Ising model

DOI10.1088/0253-6102/56/6/15zbMATH Open1247.82101OpenAlexW1580241352MaRDI QIDQ2913490FDOQ2913490

So-Ying Kwok, Chun-Dong Wang, Bao-Hua Teng, Zhen-Zhen Lu, Muk-Fung Yuen

Publication date: 26 September 2012

Published in: Communications in Theoretical Physics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1088/0253-6102/56/6/15

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zbMATH Keywords

phase transitionsferroelectricsdefect-layer

Mathematics Subject Classification ID

Lattice systems (Ising, dimer, Potts, etc.) and systems on graphs arising in equilibrium statistical mechanics (82B20) Critical phenomena in equilibrium statistical mechanics (82B27) Fundamental solutions, Green's function methods, etc. for initial value and initial-boundary value problems involving PDEs (65M80) Statistical mechanics of ferroelectrics (82D45)

Cited In (2)

• PHASE TRANSITION PROPERTIES OF FERROELECTRIC THIN FILM WITH ONE DISTINCT INSERTING-LAYER
• Effects of interface dislocations on properties of ferroelectric thin films

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