A direct impedance tomography algorithm for locating small inhomogeneities (Q1865741): Difference between revisions
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| Property / author: Michael S. Vogelius / rank | |||
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| Property / reviewed by: Karel Najzar / rank | |||
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| Property / author: Michael S. Vogelius / rank | |||
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| Property / reviewed by: Karel Najzar / rank | |||
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| Property / full work available at URL: https://doi.org/10.1007/s002110200409 / rank | |||
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Revision as of 23:42, 19 March 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | A direct impedance tomography algorithm for locating small inhomogeneities |
scientific article |
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A direct impedance tomography algorithm for locating small inhomogeneities (English)
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27 March 2003
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The authors propose a direct algorithm for determining the positions of small conductivity inhomogeneities inside an otherwise known conductor. The algorithm makes use of asymptotic expansion of the voltage potentials. The viability of this direct approach is documented by numerical examples.
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inverse problems
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asymptotic analysis
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reconstruction algorithm
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impedance tomography algorithm
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direct algorithm
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conductor
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asymptotic expansion
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numerical examples
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