Radiation-induced Soft Errors: A Chip-level Modeling Perspective (Q3069057): Difference between revisions
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Latest revision as of 01:56, 20 March 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Radiation-induced Soft Errors: A Chip-level Modeling Perspective |
scientific article |
Statements
Radiation-induced Soft Errors: A Chip-level Modeling Perspective (English)
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24 January 2011
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soft-error rate
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microprocessors
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CMOS technologies
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