Radiation-induced Soft Errors: A Chip-level Modeling Perspective
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Publication:3069057
DOI10.1561/1000000018zbMath1205.68108OpenAlexW2014215998MaRDI QIDQ3069057
Publication date: 24 January 2011
Published in: Foundations and Trends® in Electronic Design Automation (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1561/1000000018
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