Radiation-induced soft errors: a chip-level modeling perspective (Q3069057)
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scientific article; zbMATH DE number 5840665
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| English | Radiation-induced soft errors: a chip-level modeling perspective |
scientific article; zbMATH DE number 5840665 |
Statements
Radiation-induced Soft Errors: A Chip-level Modeling Perspective (English)
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24 January 2011
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soft-error rate
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microprocessors
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CMOS technologies
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0.7398170828819275
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0.7177068591117859
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0.6599825024604797
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