Radiation-induced soft errors: a chip-level modeling perspective

DOI10.1561/1000000018MaRDI QIDQ3069057zbMATH OpenOpenAlexFDO

Authors N. Seifert

Publication date 24 January 2011

Published in Foundations and Trends® in Electronic Design Automation (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1561/1000000018

zbMATH Keywords

CMOS technologiesmicroprocessorssoft-error rate

Mathematics Subject Classification ID

Computer system organization (68M99) Computing methodologies and applications (68U99)

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