Radiation-induced Soft Errors: A Chip-level Modeling Perspective (Q3069057): Difference between revisions
From MaRDI portal
Created a new Item |
Set OpenAlex properties. |
||
| (2 intermediate revisions by 2 users not shown) | |||
| Property / MaRDI profile type | |||
| Property / MaRDI profile type: MaRDI publication profile / rank | |||
Normal rank | |||
| Property / full work available at URL | |||
| Property / full work available at URL: https://doi.org/10.1561/1000000018 / rank | |||
Normal rank | |||
| Property / OpenAlex ID | |||
| Property / OpenAlex ID: W2014215998 / rank | |||
Normal rank | |||
| links / mardi / name | links / mardi / name | ||
Latest revision as of 01:56, 20 March 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Radiation-induced Soft Errors: A Chip-level Modeling Perspective |
scientific article |
Statements
Radiation-induced Soft Errors: A Chip-level Modeling Perspective (English)
0 references
24 January 2011
0 references
soft-error rate
0 references
microprocessors
0 references
CMOS technologies
0 references
