Blackbox identity testing for bounded top fanin depth-3 circuits (Q5419113): Difference between revisions
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Latest revision as of 03:13, 20 March 2024
scientific article; zbMATH DE number 6301167
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Blackbox identity testing for bounded top fanin depth-3 circuits |
scientific article; zbMATH DE number 6301167 |
Statements
Blackbox identity testing for bounded top fanin depth-3 circuits (English)
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5 June 2014
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Chinese remaindering
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blackbox
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depth-3 circuits
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derandomization
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polynomial identity testing
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fan-in
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