Nano-resolution profiling of micro-structures using quantitative X-ray phase retrieval from Fraunhofer diffraction data (Q2463340): Difference between revisions
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Latest revision as of 00:43, 4 April 2024
scientific article
Language | Label | Description | Also known as |
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English | Nano-resolution profiling of micro-structures using quantitative X-ray phase retrieval from Fraunhofer diffraction data |
scientific article |
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Nano-resolution profiling of micro-structures using quantitative X-ray phase retrieval from Fraunhofer diffraction data (English)
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5 December 2007
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