Nano-resolution profiling of micro-structures using quantitative X-ray phase retrieval from Fraunhofer diffraction data

DOI10.1016/J.PHYSLETA.2004.10.084MaRDI QIDQ2463340zbMATH OpenOpenAlexWikidataFDO

Authors Yanyan Li

Publication date 5 December 2007

Published in Physics Letters. A (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/j.physleta.2004.10.084

Mathematics Subject Classification ID

Lasers, masers, optical bistability, nonlinear optics (78A60) Quantum optics (81V80)

Recommendations

• An analytic method of phase retrieval for X-ray phase contrast imaging
• Geometry of the phase retrieval problem
• Direct phasing in femtosecond nanocrystallography. II: Phase retrieval
• Stability estimates for linearized near-field phase retrieval in X-ray phase contrast imaging
• In-line phase tomography using nonlinear phase retrieval

Cited in

(10)

• Theoretical concepts of X-ray nanoscale analysis. Theory and applications
• A coefficient inverse problem with a single measurement of phaseless scattering data
• Application of focal curves for X-ray microdiffraction methods
• Nanostructures imaging via numerical solution of a 3-D inverse scattering problem without the phase information
• Direct phasing in femtosecond nanocrystallography. I: Diffraction characteristics
• Reconstruction procedures for two inverse scattering problems without the phase information
• Two reconstruction procedures for a 3D phaseless inverse scattering problem for the generalized Helmholtz equation
• Uniqueness of a 3-D coefficient inverse scattering problem without the phase information
• A phaseless inverse scattering problem for the 3-D Helmholtz equation
• Determination of depth-dependent diffraction data: a new approach

This page was built for publication: Nano-resolution profiling of micro-structures using quantitative X-ray phase retrieval from Fraunhofer diffraction data

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q2463340)