Nano-resolution profiling of micro-structures using quantitative X-ray phase retrieval from Fraunhofer diffraction data
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Publication:2463340
DOI10.1016/J.PHYSLETA.2004.10.084zbMATH Open1123.81459OpenAlexW2041716445WikidataQ58024944 ScholiaQ58024944MaRDI QIDQ2463340FDOQ2463340
Authors: Yanyan Li 
Publication date: 5 December 2007
Published in: Physics Letters. A (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.physleta.2004.10.084
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Cited In (10)
- Theoretical concepts of X-ray nanoscale analysis. Theory and applications
- A coefficient inverse problem with a single measurement of phaseless scattering data
- Application of focal curves for X-ray microdiffraction methods
- Direct phasing in femtosecond nanocrystallography. I: Diffraction characteristics
- Nanostructures imaging via numerical solution of a 3-D inverse scattering problem without the phase information
- Reconstruction procedures for two inverse scattering problems without the phase information
- Two reconstruction procedures for a 3D phaseless inverse scattering problem for the generalized Helmholtz equation
- Uniqueness of a 3-D coefficient inverse scattering problem without the phase information
- A phaseless inverse scattering problem for the 3-D Helmholtz equation
- Determination of depth-dependent diffraction data: a new approach
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