Nano-resolution profiling of micro-structures using quantitative X-ray phase retrieval from Fraunhofer diffraction data (Q2463340)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Nano-resolution profiling of micro-structures using quantitative X-ray phase retrieval from Fraunhofer diffraction data |
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Nano-resolution profiling of micro-structures using quantitative X-ray phase retrieval from Fraunhofer diffraction data (English)
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5 December 2007
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