Numerical simulations of island formation in a coherent strained epitaxial thin film system (Q1975874): Difference between revisions

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+Stress singularities along a cycloid rough surface
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+Evolution of roughness on the surface of a strained elastic material due to stress-driven surface diffusion
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+Evolution of waviness on the surface of a strained elastic solid due to stress-driven diffusion
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+On the stability of a biaxially stressed elastic material with a free surface under variations in surface shape
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+Some general properties of stress-driven surface evolution in a heteroepitaxial thin film structure
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+Surface morphology evolution in stressed solids: Surface diffusion controlled crack initiation
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+Three-dimensional finite element analysis of the evolution of voids and thin films by strain and electromigration induced surface diffusion
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+Publication:1975874