Maximum likelihood analysis of masked series system lifetime data (Q2581649): Difference between revisions

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+https://doi.org/10.1016/j.jspi.2004.07.010
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+W2066586506
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+Bayesian analysis for masked system failure data using non-identical Weibull models
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+Bayesian Analysis of Competing Risks with Partially Masked Cause of Failure
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+Bayesian Analysis for the Poly-Weibull Distribution
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+A NOTE ON THE CONSISTENCY AND MAXIMA OF THE ROOTS OF LIKELIHOOD EQUATIONS
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+Q3873370
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+Q4139463
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+Nonparametric Prevalence and Mortality Estimators for Animal Experiments With Incomplete Cause-of-Death Data
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+Interval estimation from censored and masked system-failure data
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+Better Bootstrap Confidence Intervals
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+Inference about Defects in the Presence of Masking
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+Survival with competing risks and masked causes of failures
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+Parametric modeling for survival with competing risks and masked failure causes
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+Maximum Likelihood Estimation in a Minimum-Type Model With Exponential and Weibull Failure Modes
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+Estimating system and component reliabilities under partial information on cause of failure
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+Dependent masking and system life data analysis: Bayesian inference for two-component systems
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+The bootstrap and Edgeworth expansion
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+Bayesian reliability modeling for masked system lifetime data
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+Exact maximum likelihood estimation using masked system data
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+Q3949804
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+A Multivariate Exponential Distribution
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+Life Tests under Dependent Competing Causes of Failure
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+Bayesian analysis of incomplete time and cause of failure data
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+Q3473955
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+Bayesian Inference for Masked System Lifetime Data
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+On the Strong Law of Large Numbers and Related Results for Quasi-Stationary Sequences
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+Maximum likelihood analysis of component reliability using masked system life-test data
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+Algorithm AS 139: Maximum Likelihood Estimation in a Linear Model from Confined and Censored Normal Data
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+On the convergence properties of the EM algorithm
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+Publication:2581649