Maximum likelihood analysis of masked series system lifetime data
From MaRDI portal
Publication:2581649
DOI10.1016/j.jspi.2004.07.010zbMath1077.62095OpenAlexW2066586506MaRDI QIDQ2581649
Publication date: 10 January 2006
Published in: Journal of Statistical Planning and Inference (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.jspi.2004.07.010
EM algorithmWeibull distributionBootstrapCompeting risksAsymptotic propertiesRandom censoringMasking probabilitiesMinimum random subset
Lua error in Module:PublicationMSCList at line 37: attempt to index local 'msc_result' (a nil value).
Related Items (14)
A consistent NPMLE of the joint distribution function with competing risks data under the dependent masking and right-censoring model ⋮ Analysis of masked competing risks data with cause and time dependent masking mechanism ⋮ Multiple imputation of masked competing risks data using machine learning algorithms ⋮ The random partition masking model for interval-censored and masked competing risks data ⋮ Robust Bayesian estimation of cumulative incidence function for competing risk data with missing causes ⋮ Random partition masking model for censored and masked competing risks data ⋮ Analysis of masked data with Lindley failure model ⋮ About conditional masking probability models ⋮ A Proportional Hazards Cure Model for the Analysis of Time to Event with Frequently Unidentifiable Causes ⋮ Identifiability of masking probabilities in competing risks models with emphasis on Weibull models ⋮ Inference About the Masking Probabilities in the Competing Risks Model ⋮ Bayesian Analysis of Masked Series System Lifetime Data ⋮ Current status data with two competing risks and missing failure types: a parametric approach ⋮ Bayesian Analysis of Masked Data in Step-stress Accelerated Life Testing
Uses Software
Cites Work
- Unnamed Item
- Unnamed Item
- Unnamed Item
- Unnamed Item
- On the convergence properties of the EM algorithm
- Estimating system and component reliabilities under partial information on cause of failure
- Bayesian analysis for masked system failure data using non-identical Weibull models
- Bayesian analysis of incomplete time and cause of failure data
- Parametric modeling for survival with competing risks and masked failure causes
- Dependent masking and system life data analysis: Bayesian inference for two-component systems
- Bayesian reliability modeling for masked system lifetime data
- Interval estimation from censored and masked system-failure data
- Bayesian Analysis of Competing Risks with Partially Masked Cause of Failure
- Nonparametric Prevalence and Mortality Estimators for Animal Experiments With Incomplete Cause-of-Death Data
- Better Bootstrap Confidence Intervals
- Maximum likelihood analysis of component reliability using masked system life-test data
- Survival with competing risks and masked causes of failures
- Algorithm AS 139: Maximum Likelihood Estimation in a Linear Model from Confined and Censored Normal Data
- On the Strong Law of Large Numbers and Related Results for Quasi-Stationary Sequences
- Maximum Likelihood Estimation in a Minimum-Type Model With Exponential and Weibull Failure Modes
- Bayesian Analysis for the Poly-Weibull Distribution
- Exact maximum likelihood estimation using masked system data
- Inference about Defects in the Presence of Masking
- Life Tests under Dependent Competing Causes of Failure
- Bayesian Inference for Masked System Lifetime Data
- A Multivariate Exponential Distribution
- A NOTE ON THE CONSISTENCY AND MAXIMA OF THE ROOTS OF LIKELIHOOD EQUATIONS
- The bootstrap and Edgeworth expansion
This page was built for publication: Maximum likelihood analysis of masked series system lifetime data