Maximum likelihood analysis of component reliability using masked system life-test data
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(34)- Parameter estimations in a general hazard rate model using masked data
- Estimating system and component reliabilities under partial information on cause of failure
- Analysis for partially accelerated dependent competing risks model with masked data based on copula function
- Improved maximum likelihood estimation for component reliabilities with Miyakawa-Usher-Hodgson-Guess' estimators under censored search for the cause of failure
- Parameter estimates of general failure rate model: a Bayesian approach
- Bayes empirical Bayes classification of components using masked data
- ANALYSIS OF MASKED DATA IN A DEPENDENT COMPETING RISKS MODEL UNDER UNKNOWN ENVIRONMENT
- Modelling recall-based competing risks data withkdifferent models
- Bayesian analysis of incomplete time and cause of failure data
- Semiparametric inference of competing risks data with additive hazards and missing cause of failure under MCAR or MAR assumptions
- Estimating component characteristics from system failure-time data
- Bayesian analysis of masked data in step-stress accelerated life testing
- Tests for homogeneity of distributions of component lifetimes from type-II censored system lifetime data with known system structures
- Analysis of masked data with Lindley failure model
- Analysis of strength distributions of multi-modal failures using the EM algorithm
- An alternative competing risk model to the Weibull distribution for modelling aging in lifetime data analysis
- Dependent masking and system life data analysis: Bayesian inference for two-component systems
- Note on closed-form MLEs of failure rates in a fully parametric random censorship model with incomplete data
- Bayesian reliability modeling for masked system lifetime data
- Bayes estimators for reliability measures in geometric distribution model using masked system life test data
- Identifiability of masking probabilities in competing risks models with emphasis on Weibull models
- Estimation of components reliability in a parallel system using masked system life data
- Parameter estimations in linear failure rate model using masked data.
- Maximum likelihood analysis of masked series system lifetime data
- Constant stress accelerated life test on a multiple-component series system under Weibull lifetime distributions
- Statistical analysis of series system for masked data under successive censored life test
- Bayesian analysis for masked system failure data using non-identical Weibull models
- Estimation of system components reliabilities using masked data
- Reliability analysis of masked data for exponentially distributed components under multiple type-II censoring
- Inference for a series system with dependent masked data under progressive interval censoring
- Empirical likelihood ratio tests for homogeneity of component lifetime distributions based on system lifetime data
- A latent variable approach to the analysis of progressively hybrid censored masked data
- On competing risks with masked failures
- Life testing for multi-component systems with incomplete information on the cause of failure: a study on some inspection strategies
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