Estimation of components reliability in a parallel system using masked system life data
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- scientific article; zbMATH DE number 509168
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Cites work
- scientific article; zbMATH DE number 3928158 (Why is no real title available?)
- scientific article; zbMATH DE number 3963037 (Why is no real title available?)
- Exact maximum likelihood estimation using masked system data
- Maximum likelihood analysis of component reliability using masked system life-test data
Cited in
(13)- Parameter estimations in a general hazard rate model using masked data
- Reliability analysis of the components under censored samples containing masked data
- Analysis of masked data with Lindley failure model
- Reliability analysis for parallel system with masked data
- Reliability nonparametric Bayesian estimation for the masked data of parallel systems in step-stress accelerated life tests
- Statistical analysis of parallel system for masked data under successive censored life test
- Bayes estimators for reliability measures in geometric distribution model using masked system life test data
- Statistical analysis of series system for masked data under successive censored life test
- Reliability estimation of components in system under multiple type-II censoring samples using masked data
- Estimation of system components reliabilities using masked data
- scientific article; zbMATH DE number 6832058 (Why is no real title available?)
- Inference for a series system with dependent masked data under progressive interval censoring
- Robust Bayesian analysis for parallel system with masked data under inverse Weibull lifetime distribution
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