Reliability analysis for parallel system with masked data
From MaRDI portal
Publication:4688657
DOI10.16152/J.CNKI.XDXBZR.2018-02-002zbMATH Open1413.62170MaRDI QIDQ4688657FDOQ4688657
Authors: Xiaolin Shi, Yimin Shi, Junjie Duan
Publication date: 22 October 2018
Recommendations
- Estimation of components reliability in a parallel system using masked system life data
- Bayesian reliability modeling for masked system lifetime data
- Reliability estimation of components in system under multiple type-II censoring samples using masked data
- scientific article; zbMATH DE number 7113415
- Reliability analysis of the components under censored samples containing masked data
Point estimation (62F10) Reliability and life testing (62N05) Parametric tolerance and confidence regions (62F25)
Cited In (9)
- Reliability analysis of the components under censored samples containing masked data
- Reliability analysis for parallel-series system with masked data based on copula theory
- Reliability nonparametric Bayesian estimation for the masked data of parallel systems in step-stress accelerated life tests
- Statistical analysis of parallel system for masked data under successive censored life test
- Application of a cure rate model in reliability analysis for masked data
- Estimation of components reliability in a parallel system using masked system life data
- Reliability estimation of components in system under multiple type-II censoring samples using masked data
- Estimation of system components reliabilities using masked data
- Title not available (Why is that?)
This page was built for publication: Reliability analysis for parallel system with masked data
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q4688657)