Bayesian reliability modeling for masked system lifetime data
From MaRDI portal
Publication:1976503
DOI10.1016/S0167-7152(99)00160-1zbMath0968.62072MaRDI QIDQ1976503
Publication date: 17 September 2001
Published in: Statistics \& Probability Letters (Search for Journal in Brave)
Bayesian inference (62F15) Estimation in survival analysis and censored data (62N02) Reliability and life testing (62N05)
Related Items (20)
Analysis of masked competing risks data with cause and time dependent masking mechanism ⋮ Robust estimation with variational Bayes in presence of competing risks ⋮ Multiple imputation of masked competing risks data using machine learning algorithms ⋮ Robust Bayesian estimation of cumulative incidence function for competing risk data with missing causes ⋮ Competing risks analysis for dependent causes using Marshall-Olkin bivariate generalized lifetime family ⋮ Random partition masking model for censored and masked competing risks data ⋮ Analysis of masked data with Lindley failure model ⋮ A Metaheuristic Approach to Parameter Estimation of a Flexible Parametric Mixture Cure Rate Model with Interval-Censored Data ⋮ Polyhazard models with dependent causes ⋮ Bayesian reliability modeling for masked system lifetime data ⋮ Posterior analysis of latent competing risk models by parallel tempering ⋮ About conditional masking probability models ⋮ Bayesian inference for polyhazard models in the presence of covariates. ⋮ Influence diagnostics for polyhazard models in the presence of covariates ⋮ Identifiability of masking probabilities in competing risks models with emphasis on Weibull models ⋮ Inference About the Masking Probabilities in the Competing Risks Model ⋮ Maximum likelihood analysis of masked series system lifetime data ⋮ Bayesian Analysis of Masked Series System Lifetime Data ⋮ Bayesian Analysis of Masked Data in Step-stress Accelerated Life Testing ⋮ Constant Stress Accelerated Life Test on a Multiple-Component Series System under Weibull Lifetime Distributions
Cites Work
- Unnamed Item
- Unnamed Item
- Estimating system and component reliabilities under partial information on cause of failure
- Improved maximum likelihood estimation for component reliabilities with Miyakawa-Usher-Hodgson-Guess' estimators under censored search for the cause of failure
- Bayesian analysis of incomplete time and cause of failure data
- Dependent masking and system life data analysis: Bayesian inference for two-component systems
- Bayesian reliability modeling for masked system lifetime data
- Bayesian Computation for Nonhomogeneous Poisson Processes in Software Reliability
- Interval estimation from censored and masked system-failure data
- Sampling-Based Approaches to Calculating Marginal Densities
- Stochastic Relaxation, Gibbs Distributions, and the Bayesian Restoration of Images
- Nonparametric Prevalence and Mortality Estimators for Animal Experiments With Incomplete Cause-of-Death Data
- The Calculation of Posterior Distributions by Data Augmentation
- Maximum likelihood analysis of component reliability using masked system life-test data
- Survival with competing risks and masked causes of failures
- A Predictive Approach to Model Selection
- Exact maximum likelihood estimation using masked system data
- Inference about Defects in the Presence of Masking
- Bayesian Inference for Masked System Lifetime Data
- Bayesian computation for the superposition of nonhomogeneous poisson processes
- Equation of State Calculations by Fast Computing Machines
This page was built for publication: Bayesian reliability modeling for masked system lifetime data
