Bayesian analysis of incomplete time and cause of failure data

DOI10.1016/S0378-3758(96)00103-6zbMath0874.62118MaRDI QIDQ1361736

Chiranjit Mukhopadhyay, Asit P. Basu

Publication date: 26 August 1997

Published in: Journal of Statistical Planning and Inference (Search for Journal in Brave)

zbMATH Keywords

EM algorithm; masking; Bayesian estimation; likelihood function; competing risks

Mathematics Subject Classification ID

62F15: Bayesian inference

62N05: Reliability and life testing

Related Items

Bayesian analysis for masked system failure data using non-identical Weibull models, Bayesian reliability modeling for masked system lifetime data, Maximum likelihood analysis of masked series system lifetime data, Bayesian Analysis of a Superimposed Renewal Process, Bayesian Analysis of Competing Risks with Partially Masked Cause of Failure, Bayesian Analysis of Masked Series System Lifetime Data

Cites Work

• Unnamed Item
• Unnamed Item
• Unnamed Item
• Unnamed Item
• On the convergence properties of the EM algorithm
• Statistical decision theory and Bayesian analysis. 2nd ed
• Estimating system and component reliabilities under partial information on cause of failure
• Interval estimation from censored and masked system-failure data
• Maximum likelihood analysis of component reliability using masked system life-test data
• Bayesian Analysis for the Poly-Weibull Distribution
• Bayesian Inference for Masked System Lifetime Data
• A Multivariate Exponential Distribution
• Asymptotic Expansions Associated with Posterior Distributions