Bayesian analysis of incomplete time and cause of failure data

DOI10.1016/S0378-3758(96)00103-6zbMath0874.62118OpenAlexW2013981617MaRDI QIDQ1361736

Chiranjit Mukhopadhyay, Asit P. Basu

Publication date: 26 August 1997

Published in: Journal of Statistical Planning and Inference (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/s0378-3758(96)00103-6

zbMATH Keywords

EM algorithmmaskingBayesian estimationlikelihood functioncompeting risks

Mathematics Subject Classification ID

Bayesian inference (62F15) Reliability and life testing (62N05)

Related Items

Bayes estimation for the Marshall-Olkin bivariate Weibull distribution ⋮ Robust estimation with variational Bayes in presence of competing risks ⋮ The random partition masking model for interval-censored and masked competing risks data ⋮ Bayesian analysis of progressively censored competing risks data ⋮ Analysis of hybrid censored competing risks data ⋮ Robust Bayesian estimation of cumulative incidence function for competing risk data with missing causes ⋮ Bayesian inference for the parameters of mortality rate in the models of dependent lives with application in life insurance ⋮ Bayesian reliability modeling for masked system lifetime data ⋮ Nonparametric Bayesian Analysis of Competing Risks Problem with Masked Data ⋮ Bayesian Analysis of a Superimposed Renewal Process ⋮ Bayes estimation for the Block and Basu bivariate and multivariate Weibull distributions ⋮ NON BAYESIAN AND BAYESIAN ESTIMATION FOR THE BIVARIATE GENERALIZED LINDLEY DISTRIBUTION ⋮ Bayesian analysis for masked system failure data using non-identical Weibull models ⋮ Maximum likelihood analysis of masked series system lifetime data ⋮ Bayesian Analysis of Competing Risks with Partially Masked Cause of Failure ⋮ Bayesian Analysis of Masked Series System Lifetime Data ⋮ Bayesian Analysis of Masked Data in Step-stress Accelerated Life Testing

Cites Work

• On the convergence properties of the EM algorithm
• Statistical decision theory and Bayesian analysis. 2nd ed
• Estimating system and component reliabilities under partial information on cause of failure
• Interval estimation from censored and masked system-failure data
• Maximum likelihood analysis of component reliability using masked system life-test data
• Bayesian Analysis for the Poly-Weibull Distribution
• Bayesian Inference for Masked System Lifetime Data
• A Multivariate Exponential Distribution
• Asymptotic Expansions Associated with Posterior Distributions
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