Bayesian analysis of incomplete time and cause of failure data

DOI10.1016/S0378-3758(96)00103-6zbMATH Open0874.62118OpenAlexW2013981617MaRDI QIDQ1361736FDOQ1361736

Authors: Chiranjit Mukhopadhyay, Asit P. Basu 

Publication date: 26 August 1997

Published in: Journal of Statistical Planning and Inference (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/s0378-3758(96)00103-6

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zbMATH Keywords

competing risksEM algorithmBayesian estimationlikelihood functionmasking

Mathematics Subject Classification ID

Bayesian inference (62F15) Reliability and life testing (62N05)

Cites Work

• Title not available (Why is that?)
• On the convergence properties of the EM algorithm
• Statistical decision theory and Bayesian analysis. 2nd ed
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• A Multivariate Exponential Distribution
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• Bayesian Inference for Masked System Lifetime Data
• Asymptotic Expansions Associated with Posterior Distributions
• Bayesian Analysis for the Poly-Weibull Distribution
• Title not available (Why is that?)
• Estimating system and component reliabilities under partial information on cause of failure
• Maximum likelihood analysis of component reliability using masked system life-test data
• Interval estimation from censored and masked system-failure data

Cited In (22)

• Robust Bayesian estimation of cumulative incidence function for competing risk data with missing causes
• Robust estimation with variational Bayes in presence of competing risks
• Bayes estimation for the Marshall-Olkin bivariate Weibull distribution
• Bayesian analysis of masked data in step-stress accelerated life testing
• Bayesian Analysis of Failure Time Data Using P-Splines
• Title not available (Why is that?)
• A Bayesian approach to competing risks model with masked causes of failure and incomplete failure times
• Non Bayesian and Bayesian estimation for the bivariate generalized Lindley distribution
• Bayesian reliability modeling for masked system lifetime data
• Bayesian analysis of a superimposed renewal process
• Nonparametric Bayesian analysis of competing risks problem with masked data
• Maximum likelihood analysis of masked series system lifetime data
• Bayes estimation for the Block and Basu bivariate and multivariate Weibull distributions
• Bayesian analysis of progressively censored competing risks data
• Bayesian analysis for partially complete time and type of failure data
• Bayesian analysis for masked system failure data using non-identical Weibull models
• Bayesian reconstruction of the missing failure times in exponential distribution
• Bayesian Analysis of Competing Risks with Partially Masked Cause of Failure
• Bayesian Analysis of Masked Series System Lifetime Data
• Analysis of hybrid censored competing risks data
• Bayesian inference for the parameters of mortality rate in the models of dependent lives with application in life insurance
• The random partition masking model for interval-censored and masked competing risks data

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