Bayesian analysis for masked system failure data using non-identical Weibull models

DOI10.1016/S0378-3758(98)00218-3MaRDI QIDQ1300937zbMATH OpenOpenAlexFDO

Authors Sanjib Basu, Asit P. Basu, Chiranjit Mukhopadhyay

Publication date 1999

Published in Journal of Statistical Planning and Inference (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/s0378-3758(98)00218-3

zbMATH Keywords

Weibull distributionGibbs samplingCompeting risksMaskingAdaptive rejectionLog-concave densities

Mathematics Subject Classification ID

Bayesian inference (62F15) Reliability and life testing (62N05)

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Cited in

(27)

• Posterior analysis of latent competing risk models by parallel tempering
• Robust estimation with variational Bayes in presence of competing risks
• Robust Bayesian estimation of cumulative incidence function for competing risk data with missing causes
• Bayes empirical Bayes classification of components using masked data
• Influence diagnostics for polyhazard models in the presence of covariates
• Semiparametric inference of competing risks data with additive hazards and missing cause of failure under MCAR or MAR assumptions
• Generalized exponential distribution: Bayesian estimations
• Bayesian analysis of masked data in step-stress accelerated life testing
• Analysis of masked data with Lindley failure model
• A Bayesian approach to competing risks model with masked causes of failure and incomplete failure times
• A Metaheuristic Approach to Parameter Estimation of a Flexible Parametric Mixture Cure Rate Model with Interval-Censored Data
• Parameter estimation under failure-censored constant-stress life testing model: a Bayesian approach
• Bayesian reliability modeling for masked system lifetime data
• Optimal task-driven time-dependent covariate-based maintenance policy
• Polyhazard models with dependent causes
• Identifiability of masking probabilities in competing risks models with emphasis on Weibull models
• Nonparametric Bayesian analysis of competing risks problem with masked data
• Bayesian inference for polyhazard models in the presence of covariates.
• Maximum likelihood analysis of masked series system lifetime data
• Constant stress accelerated life test on a multiple-component series system under Weibull lifetime distributions
• Classification on defective items using unidentified samples
• Estimation of component mean lifetimes of a masked system using unclassified system life data
• Bayes estimation of Gompertz distribution parameters and acceleration factor under partially accelerated life tests with type-I censoring
• Bayesian Analysis of Competing Risks with Partially Masked Cause of Failure
• Bayesian Analysis of Masked Series System Lifetime Data
• Inference About the Masking Probabilities in the Competing Risks Model
• The random partition masking model for interval-censored and masked competing risks data

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