Bayesian analysis for masked system failure data using non-identical Weibull models

DOI10.1016/S0378-3758(98)00218-3zbMATH Open1057.62532OpenAlexW1975676394MaRDI QIDQ1300937FDOQ1300937

Authors: Sanjib Basu, Asit P. Basu, Chiranjit Mukhopadhyay 

Publication date: 1999

Published in: Journal of Statistical Planning and Inference (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/s0378-3758(98)00218-3

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zbMATH Keywords

Weibull distributionGibbs samplingCompeting risksMaskingAdaptive rejectionLog-concave densities

Mathematics Subject Classification ID

Bayesian inference (62F15) Reliability and life testing (62N05)

Cites Work

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• Nonparametric Prevalence and Mortality Estimators for Animal Experiments With Incomplete Cause-of-Death Data
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• Estimating system and component reliabilities under partial information on cause of failure
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• Bayesian analysis of incomplete time and cause of failure data
• Exact maximum likelihood estimation using masked system data
• Identifiability results for a k-out-of-p system

Cited In (27)

• Posterior analysis of latent competing risk models by parallel tempering
• Robust Bayesian estimation of cumulative incidence function for competing risk data with missing causes
• Robust estimation with variational Bayes in presence of competing risks
• Bayes empirical Bayes classification of components using masked data
• Semiparametric inference of competing risks data with additive hazards and missing cause of failure under MCAR or MAR assumptions
• Influence diagnostics for polyhazard models in the presence of covariates
• Generalized exponential distribution: Bayesian estimations
• Analysis of masked data with Lindley failure model
• Bayesian analysis of masked data in step-stress accelerated life testing
• A Bayesian approach to competing risks model with masked causes of failure and incomplete failure times
• A Metaheuristic Approach to Parameter Estimation of a Flexible Parametric Mixture Cure Rate Model with Interval-Censored Data
• Parameter estimation under failure-censored constant-stress life testing model: a Bayesian approach
• Bayesian reliability modeling for masked system lifetime data
• Optimal task-driven time-dependent covariate-based maintenance policy
• Polyhazard models with dependent causes
• Identifiability of masking probabilities in competing risks models with emphasis on Weibull models
• Nonparametric Bayesian analysis of competing risks problem with masked data
• Bayesian inference for polyhazard models in the presence of covariates.
• Constant stress accelerated life test on a multiple-component series system under Weibull lifetime distributions
• Maximum likelihood analysis of masked series system lifetime data
• Classification on defective items using unidentified samples
• Estimation of component mean lifetimes of a masked system using unclassified system life data
• Bayes estimation of Gompertz distribution parameters and acceleration factor under partially accelerated life tests with type-I censoring
• Bayesian Analysis of Competing Risks with Partially Masked Cause of Failure
• Bayesian Analysis of Masked Series System Lifetime Data
• Inference About the Masking Probabilities in the Competing Risks Model
• The random partition masking model for interval-censored and masked competing risks data

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