Constant Stress Accelerated Life Test on a Multiple-Component Series System under Weibull Lifetime Distributions
From MaRDI portal
Publication:2876214
DOI10.1080/03610926.2013.809115zbMath1462.62617MaRDI QIDQ2876214
No author found.
Publication date: 18 August 2014
Published in: Communications in Statistics - Theory and Methods (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/03610926.2013.809115
90B25: Reliability, availability, maintenance, inspection in operations research
62N05: Reliability and life testing
62N86: Fuzziness, and survival analysis and censored data
Related Items
Gamma Degradation Models: Inference and Optimal Design, A comparison of different least-squares methods for reliability of Weibull distribution based on right censored data, Inference on constant stress accelerated life tests for log-location-scale lifetime distributions with type-I hybrid censoring, Inference for a series system with dependent masked data under progressive interval censoring, Bayesian accelerated life testing under competing log-location-scale family of causes of failure, Bayesian analysis of constant-stress accelerated life test for the Weibull distribution using noninformative priors, Bayesian accelerated life test plans for series systems with Weibull component lifetimes
Cites Work
- Bootstrap methods: another look at the jackknife
- Bayesian analysis for masked system failure data using non-identical Weibull models
- Linear Bayesian inference for accelerated Weibull model
- Analysis of incomplete data in presence of competing risks.
- Estimation of system components reliabilities using masked data
- Bayesian reliability modeling for masked system lifetime data
- Competing failure modes in accelerated life testing
- Maximum likelihood analysis of component reliability using masked system life-test data
- Analysis of strength distributions of multi-modal failures using the EM algorithm
