Maximum likelihood analysis of component reliability using masked system life-test data
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Publication:3806634
DOI10.1109/24.9880zbMath0658.62119OpenAlexW2124687376MaRDI QIDQ3806634
John S. Usher, Thom J. Hodgson
Publication date: 1988
Published in: IEEE Transactions on Reliability (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1109/24.9880
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