Dependent masking and system life data analysis: Bayesian inference for two-component systems

DOI10.1007/BF00985260MaRDI QIDQ1895389zbMATH OpenWikidataFDO

Authors Irwin Guttman, Dennis K. J. Lin, Benjamin Reiser, John S. Usher

Publication date 3 October 1995

Published in Lifetime Data Analysis (Search for Journal in Brave)

zbMATH Keywords

posterior meandependent maskingestimating component reliabilitiesmasked system life datatwo-component system of exponentially distributed components

Mathematics Subject Classification ID

Bayesian inference (62F15) Reliability and life testing (62N05)

Recommendations

• Bayesian Inference for Masked System Lifetime Data
• Bayesian Analysis of Masked Series System Lifetime Data
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• Parametric inference for component distributions from lifetimes of systems with dependent components
• Robust Bayesian analysis for parallel system with masked data under inverse Weibull lifetime distribution
• A Bayesian approach to system reliability when two components are dependent

Cites work

• Bayesian Inference for Masked System Lifetime Data
• Estimating system and component reliabilities under partial information on cause of failure
• Interval estimation from censored and masked system-failure data
• Maximum likelihood analysis of component reliability using masked system life-test data
• Nonparametric Prevalence and Mortality Estimators for Animal Experiments With Incomplete Cause-of-Death Data

Cited in

(22)

• Statistical inference for masked data
• Robust estimation with variational Bayes in presence of competing risks
• Robust Bayesian estimation of cumulative incidence function for competing risk data with missing causes
• Bayesian Inference for Masked System Lifetime Data
• ANALYSIS OF MASKED DATA IN A DEPENDENT COMPETING RISKS MODEL UNDER UNKNOWN ENVIRONMENT
• Semiparametric inference of competing risks data with additive hazards and missing cause of failure under MCAR or MAR assumptions
• Random partition masking model for censored and masked competing risks data
• Bayesian analysis of masked data in step-stress accelerated life testing
• Analysis of masked data with Lindley failure model
• Inference for the dependent competing risks model with masked causes of failure
• SC-CR algorithms with informative masking
• A Bayesian approach to competing risks model with masked causes of failure and incomplete failure times
• Bayesian reliability modeling for masked system lifetime data
• Nonparametric Bayesian analysis of competing risks problem with masked data
• Modeling multiple risks in the presence of double censoring
• Maximum likelihood analysis of masked series system lifetime data
• About conditional masking probability models
• Bayesian analysis for masked system failure data using non-identical Weibull models
• Bayesian inference based on partial monitoring of components with applications to preventive system maintenance
• Multiple imputation of masked competing risks data using machine learning algorithms
• Bayesian Analysis of Masked Series System Lifetime Data
• Inference About the Masking Probabilities in the Competing Risks Model

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