Bayesian analysis of masked data in step-stress accelerated life testing

DOI10.1080/03610918.2013.848894MaRDI QIDQ2876122zbMATH OpenOpenAlexFDO

Authors Ancha Xu, Qiang Guan, Yincai Tang

Publication date 18 August 2014

Published in Communications in Statistics. Simulation and Computation (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1080/03610918.2013.848894

zbMATH Keywords

Gibbs samplingmasked datanoninformative priorstep-stress ALTWeibull distribution

Mathematics Subject Classification ID

Bayesian inference (62F15) Estimation in survival analysis and censored data (62N02)

Recommendations

• Reliability analysis of masked data in adaptive step-stress partially accelerated lifetime tests with progressive removal
• Reliability nonparametric Bayesian estimation for the masked data of parallel systems in step-stress accelerated life tests
• Accelerated life tests for log-normal series system with dependent masked data under type-I progressive hybrid censoring
• Constant stress accelerated life test on a multiple-component series system under Weibull lifetime distributions
• Bayesian estimation of step-stress accelerated life testing of Weibull distribution

Cites work

• Accelerated Life Testing - Step-Stress Models and Data Analyses
• Adaptive Rejection Sampling for Gibbs Sampling
• Bayesian analysis for masked system failure data using non-identical Weibull models
• Bayesian analysis of incomplete time and cause of failure data
• Bayesian Inference for Masked System Lifetime Data
• Bayesian reliability modeling for masked system lifetime data
• Dependent masking and system life data analysis: Bayesian inference for two-component systems
• Exact maximum likelihood estimation using masked system data
• Maximum likelihood analysis of component reliability using masked system life-test data
• Maximum likelihood analysis of masked series system lifetime data

Cited in

(11)

• Constant stress accelerated life test on a multiple-component series system under Weibull lifetime distributions
• Accelerated life tests for log-normal series system with dependent masked data under type-I progressive hybrid censoring
• Joint modeling of linear degradation and failure time data with masked causes of failure under simple step-stress test
• Robust Bayesian analysis for parallel system with masked data under inverse Weibull lifetime distribution
• Bayesian analysis for dependent competing risks model with masked causes of failure in step-stress accelerated life test under progressive hybrid censoring
• Improved likelihood inferences for Weibull regression model
• Inference for a series system with dependent masked data under progressive interval censoring
• Reliability analysis of masked data in adaptive step-stress partially accelerated lifetime tests with progressive removal
• On competing risk model under step-stress stage life testing
• Reliability nonparametric Bayesian estimation for the masked data of parallel systems in step-stress accelerated life tests
• Semiparametric estimation for proportional hazards mixture cure model allowing non-curable competing risk

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