Reliability nonparametric Bayesian estimation for the masked data of parallel systems in step-stress accelerated life tests

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Publication:730563

DOI10.1016/J.CAM.2016.07.029zbMATH Open1352.62157OpenAlexW2512032955MaRDI QIDQ730563FDOQ730563

F. Zhang, Xuchao Bai, Bin Liu, Yimin Shi

Publication date: 28 December 2016

Published in: Journal of Computational and Applied Mathematics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.cam.2016.07.029





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