Bayesian analysis of incomplete time and cause of failure data

DOI10.1016/S0378-3758(96)00103-6MaRDI QIDQ1361736zbMATH OpenOpenAlexFDO

Authors Chiranjit Mukhopadhyay, Asit P. Basu

Publication date 26 August 1997

Published in Journal of Statistical Planning and Inference (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/s0378-3758(96)00103-6

zbMATH Keywords

Bayesian estimationcompeting risksEM algorithmlikelihood functionmasking

Mathematics Subject Classification ID

Bayesian inference (62F15) Reliability and life testing (62N05)

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Cites work

• A Multivariate Exponential Distribution
• Asymptotic Expansions Associated with Posterior Distributions
• Bayesian Analysis for the Poly-Weibull Distribution
• Bayesian Inference for Masked System Lifetime Data
• Estimating system and component reliabilities under partial information on cause of failure
• scientific article; zbMATH DE number 4143243 (Why is no real title available?)
• scientific article; zbMATH DE number 3938277 (Why is no real title available?)
• scientific article; zbMATH DE number 3677042 (Why is no real title available?)
• scientific article; zbMATH DE number 3567782 (Why is no real title available?)
• Interval estimation from censored and masked system-failure data
• Maximum likelihood analysis of component reliability using masked system life-test data
• On the convergence properties of the EM algorithm
• Statistical decision theory and Bayesian analysis. 2nd ed

Cited in

(22)

• Bayesian analysis for masked system failure data using non-identical Weibull models
• Bayesian reliability modeling for masked system lifetime data
• Bayes estimation for the Marshall-Olkin bivariate Weibull distribution
• Bayesian analysis of progressively censored competing risks data
• Maximum likelihood analysis of masked series system lifetime data
• Bayesian analysis of masked data in step-stress accelerated life testing
• Analysis of hybrid censored competing risks data
• Bayesian Analysis of Failure Time Data Using P-Splines
• Nonparametric Bayesian analysis of competing risks problem with masked data
• Bayesian analysis of a superimposed renewal process
• Bayesian Analysis of Competing Risks with Partially Masked Cause of Failure
• Bayesian Analysis of Masked Series System Lifetime Data
• scientific article; zbMATH DE number 1219013 (Why is no real title available?)
• Bayesian reconstruction of the missing failure times in exponential distribution
• Robust Bayesian estimation of cumulative incidence function for competing risk data with missing causes
• Bayesian analysis for partially complete time and type of failure data
• Bayes estimation for the Block and Basu bivariate and multivariate Weibull distributions
• Non Bayesian and Bayesian estimation for the bivariate generalized Lindley distribution
• The random partition masking model for interval-censored and masked competing risks data
• Bayesian inference for the parameters of mortality rate in the models of dependent lives with application in life insurance
• A Bayesian approach to competing risks model with masked causes of failure and incomplete failure times
• Robust estimation with variational Bayes in presence of competing risks

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