Interval estimation from censored and masked system-failure data

DOI10.1109/24.85440MaRDI QIDQ3355106zbMATH OpenOpenAlexFDO

Authors Necip Doganaksoy

Publication date 1991

Published in IEEE Transactions on Reliability (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/24.85440

Mathematics Subject Classification ID

Reliability and life testing (62N05)

Cited in

(7)

• Bayesian analysis of incomplete time and cause of failure data
• Dependent masking and system life data analysis: Bayesian inference for two-component systems
• Bayesian reliability modeling for masked system lifetime data
• Maximum likelihood analysis of masked series system lifetime data
• Statistical analysis of series system for masked data under successive censored life test
• Approximate confidence interval for the new extreme value distribution
• Reliability analysis of masked data for exponentially distributed components under multiple type-II censoring

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