Classification on defective items using unidentified samples

DOI10.1016/J.PATCOG.2004.05.008MaRDI QIDQ2485036zbMATH OpenOpenAlexFDO

Authors Tze Fen Li, Shui-Ching Chang

Publication date 3 August 2005

Published in Pattern Recognition (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/j.patcog.2004.05.008

zbMATH Keywords

ClassificationEmpirical BayesBayes decision ruleExponential distributionStochastic approximationUnsupervised learningQuality control

Mathematics Subject Classification ID

Pattern recognition, speech recognition (68T10)

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• A Stochastic Approximation Method
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• Bayes Empirical Bayes
• Bayes empirical Bayes: Finite parameter case
• Bayesian analysis for masked system failure data using non-identical Weibull models
• Coordinated quality control in a two-stage system
• Improved attribute acceptance sampling plans in the presence of misclassification error
• Maximum Likelihood Estimation for Multi-Risk Model
• Some Admissible Empirical Bayes Procedures

Cited in

(3)

• Bayes empirical Bayes classification of components using masked data
• Empirical Bayes decision rule for classification on defective items in Weibull distribution
• A Bayes Empirical Bayes Decision Rule for Classification

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