Classification on defective items using unidentified samples

DOI10.1016/J.PATCOG.2004.05.008zbMATH Open1101.68817OpenAlexW1966795490MaRDI QIDQ2485036FDOQ2485036

Authors: Tze Fen Li, Shui-Ching Chang 

Publication date: 3 August 2005

Published in: Pattern Recognition (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.patcog.2004.05.008

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zbMATH Keywords

ClassificationEmpirical BayesBayes decision ruleExponential distributionStochastic approximationUnsupervised learningQuality control

Mathematics Subject Classification ID

Pattern recognition, speech recognition (68T10)

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Cited In (3)

• Bayes empirical Bayes classification of components using masked data
• Empirical Bayes decision rule for classification on defective items in Weibull distribution
• A Bayes Empirical Bayes Decision Rule for Classification

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