Bayesian Analysis of Masked Series System Lifetime Data
From MaRDI portal
Publication:3435984
DOI10.1080/03610920600853357zbMath1109.62092MaRDI QIDQ3435984
Chiranjit Mukhopadhyay, Sanjib Basu
Publication date: 8 May 2007
Published in: Communications in Statistics - Theory and Methods (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/03610920600853357
reliability; censoring; Dirichlet distribution; Gibbs sampling; competing risks; log-normal distribution; normal-gamma prior; masking probabilities
62F15: Bayesian inference
62P30: Applications of statistics in engineering and industry; control charts
62N05: Reliability and life testing
Related Items
About conditional masking probability models, Bayesian Analysis of a Superimposed Renewal Process, Inference About the Masking Probabilities in the Competing Risks Model
Cites Work
- Unnamed Item
- Statistical decision theory and Bayesian analysis. 2nd ed
- Estimating system and component reliabilities under partial information on cause of failure
- Bayesian analysis for masked system failure data using non-identical Weibull models
- Bayesian analysis of incomplete time and cause of failure data
- Parametric modeling for survival with competing risks and masked failure causes
- Dependent masking and system life data analysis: Bayesian inference for two-component systems
- Bayesian reliability modeling for masked system lifetime data
- Maximum likelihood analysis of masked series system lifetime data
- Bayesian Analysis of Competing Risks with Partially Masked Cause of Failure
- Nonparametric Prevalence and Mortality Estimators for Animal Experiments With Incomplete Cause-of-Death Data
- Survival with competing risks and masked causes of failures
- Bayesian Analysis for the Poly-Weibull Distribution
- Inference about Defects in the Presence of Masking
- Bayesian Inference for Masked System Lifetime Data
