An overview on statistical analysis for masked system lifetime data

MaRDI QIDQ4927825zbMATH OpenFDO

Authors Ancha Xu, Yincai Tang

Publication date 20 June 2013

zbMATH Keywords

exponential distributionmaximum likelihood estimationWeibull distribution

Mathematics Subject Classification ID

Reliability and life testing (62N05) Applications of statistics in engineering and industry; control charts (62P30)

Recommendations

• Maximum likelihood analysis of masked series system lifetime data
• ANALYSIS OF MASKED DATA IN A DEPENDENT COMPETING RISKS MODEL UNDER UNKNOWN ENVIRONMENT
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Cited in

(9)

• Bayesian reliability modeling for masked system lifetime data
• Nonparametric Bayesian analysis of competing risks problem with masked data
• Statistical analysis of parallel system for masked data under successive censored life test
• Bayesian Analysis of Competing Risks with Partially Masked Cause of Failure
• Statistical inference for masked data
• On competing risks with masked failures
• Statistical analysis of series system for masked data under successive censored life test
• Statistical analysis of four-unit hybrid system for masked data
• Reliability analysis of masked data for exponentially distributed components under multiple type-II censoring

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