Inference about Defects in the Presence of Masking

DOI10.2307/1270608MaRDI QIDQ4365717zbMATH OpenOpenAlexFDO

Authors Betty J. Flehinger, Benjamin Reiser, Emmanuel Yashchin

Publication date 6 October 1998

Full work available at URL https://doi.org/10.2307/1270608

zbMATH Keywords

reliabilitypartial informationmaskingtwo-stage procedurescompeting causessuccess/failure data

Mathematics Subject Classification ID

Reliability and life testing (62N05)

Recommendations

• Estimation of system components reliabilities using masked data
• Survival with competing risks and masked causes of failures
• Bayesian reliability modeling for masked system lifetime data

Cited in

(9)

• Statistical inference for masked data
• A consistent NPMLE of the joint distribution function with competing risks data under the dependent masking and right-censoring model
• Random partition masking model for censored and masked competing risks data
• Bayesian reliability modeling for masked system lifetime data
• Use of additional information for current status data with two competing risks and missing failure types
• Maximum likelihood analysis of masked series system lifetime data
• Bayesian analysis for masked system failure data using non-identical Weibull models
• Current status data with two competing risks and missing failure types: a parametric approach
• Bayesian Analysis of Masked Series System Lifetime Data

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