The TTT-concept and replacements to extend system life (Q1089244): Difference between revisions

In a number of papers the current authors have illustrated how the Total Time on Test (TTT) concept can be used when analysing the ordinary age replacement problem and different generalizations thereof. In this paper we show that the TTT-concept is very useful also when analysing another replacement problem discussed by \textit{C. Derman, G. J. Lieberman} and \textit{S. M. Ross} [Oper. Res. 32, 616-627 (1984; Zbl 0544.90039)] in which the replacements of a vital component, for which there are n spare units, are made with the goal of maximizing the expected system life.