Model-based clustering for integrated circuit yield enhancement (Q857371): Difference between revisions

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+Publication
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+https://doi.org/10.1016/j.ejor.2005.11.032
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@@ Property / OpenAlex ID @@
+W2035969035
@@ Property / OpenAlex ID: W2035969035 / rank @@
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@@ Property / cites work @@
+Model-Based Gaussian and Non-Gaussian Clustering
@@ Property / cites work: Model-Based Gaussian and Non-Gaussian Clustering / rank @@
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+Markov Random Fields in Pattern Recognition for Semiconductor Manufacturing
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+A classification EM algorithm for clustering and two stochastic versions
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+Q4002793
@@ Property / cites work: Q4002793 / rank @@
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+An Introduction to the Theory of Point Processes
@@ Property / cites work: An Introduction to the Theory of Point Processes / rank @@
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+Detecting Features in Spatial Point Processes with Clutter via Model-Based Clustering
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+How Many Clusters? Which Clustering Method? Answers Via Model-Based Cluster Analysis
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+Model-Based Clustering, Discriminant Analysis, and Density Estimation
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+Monitoring Wafer Map Data from Integrated Circuit Fabrication Processes for Spatially Clustered Defects
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+Principal Curves
@@ Property / cites work: Principal Curves / rank @@
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+A unified model incorporating yield, burn-in, and reliability
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+Simulation of nonhomogeneous poisson processes by thinning
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+Estimating the dimension of a model
@@ Property / cites work: Estimating the dimension of a model / rank @@
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+Detecting Spatial Effects from Factorial Experiments: An Application from Integrated-Circuit Manufacturing
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@@ links / mardi / name / links / mardi / name @@
+Publication:857371