Model-based clustering for integrated circuit yield enhancement (Q857371): Difference between revisions

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+Model-Based Gaussian and Non-Gaussian Clustering
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+Markov Random Fields in Pattern Recognition for Semiconductor Manufacturing
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+A classification EM algorithm for clustering and two stochastic versions
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+Q4002793
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+An Introduction to the Theory of Point Processes
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+Detecting Features in Spatial Point Processes with Clutter via Model-Based Clustering
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+How Many Clusters? Which Clustering Method? Answers Via Model-Based Cluster Analysis
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+Model-Based Clustering, Discriminant Analysis, and Density Estimation
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+Monitoring Wafer Map Data from Integrated Circuit Fabrication Processes for Spatially Clustered Defects
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+Principal Curves
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+A unified model incorporating yield, burn-in, and reliability
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+Simulation of nonhomogeneous poisson processes by thinning
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+Estimating the dimension of a model
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+Detecting Spatial Effects from Factorial Experiments: An Application from Integrated-Circuit Manufacturing
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