Reliability of Complex Devices in Random Environments (Q3415833): Difference between revisions

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+MaRDI publication profile
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+Shock models with underlying birth process
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+Nonstationary shock models
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+A concept of positive dependence for exchangeable random variables
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+Optimal replacement with semi-Markov shock models
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+Optimal replacement for systems governed by Markov additive shock processes
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+Shock models and wear processes
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+Note on the behavior of thermorheologically simple materials in random temperature fields
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