Testing process capability based on<i>C<sub>pm</sub></i>in the presence of random measurement errors (Q3592053): Difference between revisions
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Property / cites work: Lower confidence bounds with sample size information for <i>C<sub>pm</sub> </i> applied to production yield assurance / rank | |||
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Property / cites work: Distributional and inferential properties of the process accuracy and process precision indices / rank | |||
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Latest revision as of 15:21, 26 June 2024
scientific article
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English | Testing process capability based on<i>C<sub>pm</sub></i>in the presence of random measurement errors |
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Testing process capability based on<i>C<sub>pm</sub></i>in the presence of random measurement errors (English)
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11 September 2007
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gauge measurement error
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lower confidence bound
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critical value
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process capability analysis
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